P-82: Diffraction Limited Resolution and Maximum Contrast for Scanning Displays

نویسندگان

  • H. Urey
  • Hakan Urey
چکیده

This paper discusses the theoretical limits for resolution (number of pixels) and maximum contrast for clipped Gaussian and Uniform profile beams in scanning display systems. The results are applicable to scanning microdisplays (e.g. Virtual Retinal Display™) and scanning projection displays.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

White-light diffraction tomography of unlabelled live cells

We present a technique called white-light diffraction tomography (WDT) for imaging microscopic transparent objects such as live unlabelled cells. The approach extends diffraction tomography to white-light illumination and imaging rather than scattering plane measurements. Our experiments were performed using a conventional phase contrast microscope upgraded with a module to measure quantitative...

متن کامل

Stretchable diffraction gratings for spectrometry.

We have investigated the possibility of using transparent stretchable diffraction gratings for spectrometric applications. The gratings were fabricated by replication of a triangular-groove master into a transparent viscoelastic. The sample length, and hence the spatial period, can be reversibly changed by mechanical stretching. When used in a monochromator with two slits, the stretchable grati...

متن کامل

Photobleaching imprinting microscopy: seeing clearer and deeper.

We present a generic sub-diffraction-limited imaging method - photobleaching imprinting microscopy (PIM) - for biological fluorescence imaging. A lateral resolution of 110 nm was measured, more than a twofold improvement over the optical diffraction limit. Unlike other super-resolution imaging techniques, PIM does not require complicated illumination modules or specific fluorescent dyes. PIM is...

متن کامل

Dark-field electron holography for strain and composition measurement with a sub-nanometre spatial resolution

Transmission electron microscopy (TEM) is a well-established tool for strain measurement that combines an excellent precision with a high spatial resolution. Strain maps can be obtained by different TEM techniques such as high-resolution transmission electron microscopy (HRTEM), high-resolution scanning transmission electron microscopy (HR-STEM), convergent beam electron diffraction, nanobeam e...

متن کامل

High numerical aperture tabletop soft x-ray diffraction microscopy with 70-nm resolution.

Light microscopy has greatly advanced our understanding of nature. The achievable resolution, however, is limited by optical wavelengths to approximately 200 nm. By using imaging and labeling technologies, resolutions beyond the diffraction limit can be achieved for specialized specimens with techniques such as near-field scanning optical microscopy, stimulated emission depletion microscopy, an...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2000